Xin Li (李鑫)
I am currently a first-year Ph.D. student at Nanyang Technological University (NTU) , Singapore, under the supervision of Prof. Chau Yuen .
I obtained my Master's degree from Peking University and Bachelor's degree from Northeastern University (CN) .
Email: li-x@ntu.edu.sg
News
- 2024.04Joined Nanyang Technological University as a Research Assistant.
Publications
Here are some of the papers I've published. You can also find them
on
Google Scholar
.(* equal contribution)
Robust Gaussian Splatting SLAM by Leveraging Loop Closure
in peer review, 2024.
arXiv /PVI-DSO: Leveraging Planar Regularities for Direct Sparse Visual-Inertial Odometry
IEEE Sensors Journal, 2023.
PDF / arXiv / code /Deep learning-based channel estimation for double-RIS aided massive MIMO system
IEEE Wireless Communications Letters (WCL), 2022.
PDF / arXiv /Co-planar parametrization for stereo-SLAM and visual-inertial odometry
IEEE Robotics and Automation Letters (RA-L), 2020.
PDF / arXiv / code /Leveraging Planar Regularities for Point Line Visual-Inertial Odometry
IROS, 2020.
PDF / arXiv / video / code /
Education
Ph.D. | Nanyang Technological University, Singapore | 2025.01 - Present |
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Supervisor: Prof. Chau Yuen | ||
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M.Eng. | Peking University | 2018.09 - 2021.07 |
Thesis: Multi-feature Simultaneous Localization and Mapping with coplanar constraints | ||
Supervisor: Prof. Jinlong Lin (林金龙) | ||
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B.Eng. | Northeastern University (CN) | 2014.09 - 2018.07 |
Experience
Research Assistant | Nanyang Technological University | 2024.04 - 2025.01 |
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SUTD, Singapore | 2021.09 - 2022.03 | |
Supervised by Prof. Chau Yuen | ||
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SLAM Engineer | Gaussian Robotics, Singapore | 2022.03 - 2024.03 |
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Research Intern | Microsoft Research Asia, Beijing | 2020.09 - 2021.04 |
Supervised by Dr. Yang Liu (刘洋) and Dr. Yizhong Zhang (张译中) | ||
Megvii (a.k.a Face++), Beijing | 2019.05 - 2020.03 | |
Supervised by Dr. Yijia He (贺一家) |
Academic Services
Conference Reviewer: IROS (2021, 2022), ICRA (2022, 2023,
2025), NeurIPS (2024), ICLR (2025), AISTATS(2025)
Journal Reviewer: IEEE RA-L, IEEE TIM